High-Quality X-ray Measurements, Without Beamline Barriers
We provide high-resolution X-ray measurements using established techniques like HR-XRPD, SAXS, Total Scattering, and PDF analysis—executed by experts, optimized for speed, and tailored to your research questions.
TS
Total Scatering
Total scattering goes beyond typical assessment of diffraction peaks to consider the diffuse inten­sities scattered underneath and in between. These carry further in­for­mation about defects, dis­order, dy­nam­ics, and mor­phol­ogy that underpin functional properties.
SAXS
Small-angle X-ray scattering
Small-angle X-ray scattering probes the material over very low spatial frequencies. This allows observations of in­ho­mo­ge­neity or periodicity in the density, which can be particularly useful for identifying microphase segregation or mesoporosity.
HR-XRPD
High-Resolution X-ray Powder Diffraction
X-ray powder diffraction is ideal for identification, refinement, and solution of microcrystalline structures. This technique provides a rapid diagnostic for detecting impurities, quantifying phases, determining molecular-scale and morphological properties of matter, and much more.
PDF
Pair distribution function analysis
The pair distribution function analysis gives an alternative perspective to the total sca­ttering signal by trans­for­ming the data to a spa­tial de­pen­den­ce, allowing pro­per­ties such as bond lengths, correlated motions, and local structural features to be observed directly.