We provide a new mode for accessing synchrotron facilities
for high-throughput powder diffraction
measurements and advanced data analytics.
X-ray powder diffraction is ideal for identification, refinement, and solution of microcrystalline structures. This technique provides a rapid diagnostic for detecting impurities, quantifying phases, determining molecular-scale and morphological properties of matter, and much more.
Total scattering goes beyond typical assessment of diffraction peaks to consider the diffuse intensities scattered underneath and in between. These carry further information about defects, disorder, dynamics, and morphology that underpin functional properties.
The pair distribution function analysis gives an alternative perspective to the total scattering signal by transforming the data to a spatial dependence, allowing properties such as bond lengths, correlated motions, and local structural features to be observed directly.
Small-angle X-ray scattering probes the material over very low spatial frequencies. This allows observations of inhomogeneity or periodicity in the density, which can be particularly useful for identifying microphase segregation or mesoporosity. It also can give information about domain morphology and size, for example, of small nanoparticles, when crystallites are sufficiently dilute.
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