High-quality X-ray measurements, without scheduling bottlenecks
We provide standardised measurements using established techniques including high-resolution powder diffraction, small-angle scattering, total scattering, and pair distribution function analysis.
HR‒XRPD
High-resolution powder diffraction
High-resolution X-ray powder diffraction (HR-XRPD) is ideal for identification, refinement, and solution of microcrystalline structures. This technique provides a rapid diagnostic for detecting impurities, quantifying phases, determining molecular-scale and morphological properties of matter, and much more.
SAXS
Small-angle scattering
Small-angle X-ray scattering (SAXS) probes the material over very low spatial frequencies. This allows observations of in­ho­mo­ge­neity or periodicity in the density, which can be particularly useful for identifying microphase segregation or mesoporosity.
TS
Total scattering
Total scattering (TS) goes beyond typical assessment of diffraction peaks to consider the diffuse inten­sities scattered underneath and in between. These carry further in­for­mation about defects, dis­order, dy­nam­ics, and mor­phol­ogy that underpin functional properties.
PDF
Pair distribution function
The pair distribution function (PDF) analysis gives an alternative perspective to the total sca­ttering signal by trans­for­ming the data to a spa­tial de­pen­den­ce, allowing pro­per­ties such as bond lengths, correlated motions, and local structural features to be observed directly.
Radically better X-ray data
Contact
Katharina Schumacher
Customer Success